Browse Books: Science / Weights & Measures

Double-Prism Multi-Mode Scanning: Principles and Technology Cover Image
Double-Prism Multi-Mode Scanning: Principles and Technology (Hardcover)
By Anhu Li
$159.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Understanding Digital Signal Processing (Springer Topics in Signal Processing #13) Cover Image
Understanding Digital Signal Processing (Springer Topics in Signal Processing #13) (Paperback)
By Orhan Gazi
$99.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Characterisation of Ferroelectric Bulk Materials and Thin Films Cover Image
Characterisation of Ferroelectric Bulk Materials and Thin Films (Paperback)
By Markys G. Cain (Editor)
$199.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Laser Measurement Technology: Fundamentals and Applications Cover Image
Laser Measurement Technology: Fundamentals and Applications (Hardcover)
By Axel Donges, Reinhard Noll
$199.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Spacecraft Tt&c and Information Transmission Theory and Technologies (Springer Aerospace Technology) Cover Image
Spacecraft Tt&c and Information Transmission Theory and Technologies (Springer Aerospace Technology) (Hardcover)
By Jiaxing Liu
$169.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Dynamic Pulsed-Field-Gradient NMR Cover Image
Dynamic Pulsed-Field-Gradient NMR (Hardcover)
By Geir Humborstad Sørland
$199.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Dynamic Pulsed-Field-Gradient NMR Cover Image
Dynamic Pulsed-Field-Gradient NMR (Paperback)
By Geir Humborstad Sørland
$199.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Ellipsometry at the Nanoscale Cover Image
Ellipsometry at the Nanoscale (Paperback)
By Maria Losurdo (Editor), Kurt Hingerl (Editor)
$349.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Coordinate Metrology: Accuracy of Systems and Measurements (Springer Tracts in Mechanical Engineering) Cover Image
Coordinate Metrology: Accuracy of Systems and Measurements (Springer Tracts in Mechanical Engineering) (Paperback)
By Jerzy A. Sladek
$199.99
Usually Available in 1-5 Days, supply chain issues may affect these times
A Practical Guide to Surface Metrology Cover Image
A Practical Guide to Surface Metrology (Paperback)
By Michael Quinten
$109.99
Usually Available in 1-5 Days, supply chain issues may affect these times
X-Ray Optics: High-Energy-Resolution Applications Cover Image
X-Ray Optics: High-Energy-Resolution Applications (Hardcover)
By Yuri Shvyd'ko
$299.99
Usually Available in 1-5 Days, supply chain issues may affect these times
Quantum Metrology with Photoelectrons: Volume II: Applications and Advances (Iop Concise Physics) Cover Image
Quantum Metrology with Photoelectrons: Volume II: Applications and Advances (Iop Concise Physics) (Hardcover)
By Paul Hockett
$74.95
Usually Available in 1-5 Days, supply chain issues may affect these times

Pages